The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Dec. 02, 2015
Applicant:

Toshiba Memory Corporation, Minato-ku, JP;

Inventors:

Takayuki Ito, Yokkaichi, JP;

Yasunori Oshima, Yokkaichi, JP;

Toshihiko Iinuma, Yokkaichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/317 (2006.01); H01L 21/66 (2006.01); H01L 21/265 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01L 22/26 (2013.01); H01J 37/244 (2013.01); H01J 37/3171 (2013.01); H01L 21/26513 (2013.01); H01L 22/14 (2013.01); H01J 2237/24405 (2013.01); H01J 2237/24528 (2013.01); H01J 2237/24542 (2013.01); H01J 2237/31703 (2013.01);
Abstract

An ion implantation apparatus includes an implantation part, a measuring part, and a controller. The ion implantation part implants ions into an implantation region located at a bottom of a concave portion provided on a semiconductor substrate. The measuring part measures an implantation amount of ions corresponding to an aspect ratio of the concave portion based on ions implanted from the implantation part thereinto, at a first position at which the semiconductor substrate is arranged when the ions are implanted into the implantation region or a second position close to the first position. The controller controls the implantation part to stop implantation of the ions into the measuring part when an accumulated amount of the implantation amount has reached a predetermined amount according to a target accumulation amount of the implantation region.


Find Patent Forward Citations

Loading…