The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Jun. 12, 2013
Applicant:

Toho Titanium Co., Ltd., Chigasaki-shi, Kanagawa, JP;

Inventors:

Takashi Oda, Chigasaki, JP;

Hisamune Tanaka, Chigasaki, JP;

Takeshi Shiraki, Chigasaki, JP;

Assignee:

TOHO TITANIUM CO., LTD., Chigasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/305 (2006.01); H01J 37/304 (2006.01); F27D 11/08 (2006.01); C22B 9/22 (2006.01); B22D 23/06 (2006.01); H01J 37/22 (2006.01); F27D 11/12 (2006.01); F27D 19/00 (2006.01); C22C 14/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/304 (2013.01); B22D 23/06 (2013.01); C22B 9/228 (2013.01); C22C 14/00 (2013.01); F27D 11/08 (2013.01); F27D 11/12 (2013.01); F27D 19/00 (2013.01); H01J 37/22 (2013.01); H01J 37/222 (2013.01); H01J 37/305 (2013.01); H01J 37/3045 (2013.01); F27D 2019/0071 (2013.01);
Abstract

An electron beam melting furnace includes a hearth, a mold, an electron gun for keeping metal as a molten state, an electron beam controller for controlling direction of the electron beam, an image sensor for molten metal, and an operating device. A method for operating the furnace includes a step of inputting electron beam emitting coordinates in the electron beam controller, a step of emitting the electron beam, a step of detecting a high electron beam intensity spot by the image sensor, a step of calculating coordinates of high electron beam intensity based on the detected signal by the operating device, a step of calculating differences between the coordinates of emission and the coordinates of high electron beam intensity spot, a step of inputting the difference in the electron beam controller, and a step of controlling the location of electron beam spot.


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