The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Oct. 07, 2015
Applicant:

Palantir Technologies, Inc., Palo Alto, CA (US);

Inventors:

Peter Maag, New York, NY (US);

Jacob Albertson, New York, NY (US);

Jared Newman, Canberra, AU;

Matthew Lynch, New York, NY (US);

Maciej Albin, London, GB;

Viktor Nordling, Watson, AU;

Assignee:

Palantir Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/0775 (2013.01); G06F 11/0751 (2013.01);
Abstract

Discussed herein are embodiments of methods and systems which allow engineers or administrators to create modular plugins which represent the logic for various fault detection tests that can be performed on data pipelines and shared among different software deployments. In some cases, the modular plugins each define a particular test to be executed against data received from the pipeline in addition to one or more configuration points. The configuration points represent configurable arguments, such as variables and/or functions, referenced by the instructions which implement the tests and that can be set according to the specific operation environment of the monitored pipeline.


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