The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Dec. 12, 2013
Rapiscan Systems, Inc., Torrance, CA (US);
Robert A. Armistead, Jr., Los Altos Hills, CA (US);
William Chang, Newark, CA (US);
Edward D. Franco, San Mateo, CA (US);
Joseph Bendahan, San Jose, CA (US);
Jolyon A. Browne, San Jose, CA (US);
Rapiscan Systems, Inc., Torrance, CA (US);
Abstract
The present invention is directed to an inspection system that has a radiation source, a detector array, an inspection region, and a processing unit, where the processing unit a) obtains a radiographic image, b) segments the radiographic image based on radiation attenuation or transmission, c) identifies at least one segmented area on the radiographic image, d) filters the at least one segmented area using at least one geometric filter, e) generates feature vectors using the filtered segmented area; and f) compares the feature vectors against predefined values to determine whether a high-atomic-number object is present.