The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Mar. 14, 2016
David E. Diller, Greenwood Village, CO (US);
David E. Diller, Greenwood Village, CO (US);
NANOSEIS LLC, Greenwood Village, CO (US);
Abstract
Disclosed herein are various embodiments of methods and systems for optimizing the analysis of the source locations of microseismic sources, comprising recording microseismic data using patches of sensors. Each patch contains multiple sensors, arranged as a grid or a line segment. This approach uses fewer sensors and can cover a larger area than previous techniques for acquiring microseismic data. The data recorded in this way can be filtered using directional filters, such that each patch may be targeted at a specific point in the subsurface. The microseismic source-scanning algorithm benefits from having data filtered to include directional signals only from pairs of patch locations and subsurface locations. This produces an improved estimate of the locations of microseismic events. The patches may be disposed about a horizontal well bore, and aligned such that directional filtering enhances data from hydraulic fracturing operations in the wellbore.