The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9772385 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 26, 2017

Filed:

Jun. 24, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Oki Gunawan, Westwood, NJ (US);

Michael A. Pereira, Mohegan Lake, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/07 (2006.01); G01N 27/72 (2006.01);
U.S. Cl.
CPC ...
G01R 33/072 (2013.01); G01N 27/72 (2013.01); G01R 33/07 (2013.01);
Abstract

A rotating magnetic field Hall apparatus is provided and includes first and second magnets disposed in a master-slave configuration, a device-under-test (DUT) stage interposable between the first and second magnets on which a DUT is disposable in first or second orientations for Hall measurement or photoelectromagnetic (PEM) testing, respectively, controllers disposed to center the DUT stage between the first and second magnets and orthogonal magnetic field sensors disposed aside lateral sides of the first magnet to facilitate positional initialization of the first and second magnets and to generate in-phase and out-of-phase reference signals for phase-sensitive or lock-in Hall signal detection. The system also includes software system to perform signal processing to yield the final Hall signal.


Find Patent Forward Citations

Gunawan, Oki. (2017). Rotating magnetic field hall measurement system (U.S. Patent No. 9772385). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9772385

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