The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Nov. 07, 2016
Applicant:
Qualitau, Inc., Mountain View, CA (US);
Inventors:
Jens Ullmann, San Jose, CA (US);
Gedaliahoo Krieger, Rehovot, IL;
James Borthwick, Santa Clara, CA (US);
Assignee:
QualiTau, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/30 (2006.01); H03F 3/45 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/30 (2013.01); G01R 31/2858 (2013.01); H03F 3/45475 (2013.01); H03F 2200/129 (2013.01); H03F 2203/45526 (2013.01);
Abstract
Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.