The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Oct. 23, 2013
Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventors:

Takuji Kataoka, Hamamatsu, JP;

Taira Ito, Hamamatsu, JP;

Natsumi Saito, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/00 (2006.01); G01N 21/00 (2006.01); G01N 33/48 (2006.01); G01N 33/483 (2006.01); G01N 21/64 (2006.01); G01N 15/14 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4836 (2013.01); G01N 15/1031 (2013.01); G01N 15/1431 (2013.01); G01N 15/1434 (2013.01); G01N 15/1436 (2013.01); G01N 15/1456 (2013.01); G01N 15/1484 (2013.01); G01N 21/6452 (2013.01); G01N 2015/0065 (2013.01); G01N 2015/1006 (2013.01);
Abstract

A cell observation system, for measuring fluorescence emitted from a cell held by a microplatehaving a plurality of wells, comprises a microplate holderfor mounting the microplate, an electrical stimulatorarranged with a plurality of electrode pairsincluding positive and negative electrodes, a position controllerfor controlling a position of the electrical stimulatorso as to place the electrode pairswithin the wells, a moving image acquisition unitfor detecting the fluorescence from the sample S within the wells, and a data analyzerfor setting a part of a region facing the positive electrodeon the wellas an analysis region and analyzing an optical intensity in the analysis region so as to acquire analysis information concerning the sample S.


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