The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Dec. 24, 2015
Nuctech Company Limited, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Yuanjing Li, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yinong Liu, Beijing, CN;
Yaohong Liu, Beijing, CN;
Qiufeng Ma, Beijing, CN;
Huishao He, Beijing, CN;
Weiping Zhu, Beijing, CN;
Xiang Zou, Beijing, CN;
Jianping Chang, Beijing, CN;
Song Liang, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The present invention discloses a gas analyzing apparatus and a sampling device. The gas analyzing apparatus includes a sampling device and an ion mobility spectrum analysis device. The sampling device includes a multi-capillary column and a temperature control system. The ion mobility spectrum analysis device is adapted for analyzing a gas leaded-in by the sampling device and includes a reaction cavity for reaction between sample molecules and reaction ions, the cavity having a sampling opening for leading-in of the gas. An outlet end of the multi-capillary column is inserted directly into the cavity of the ion mobility spectrum analysis device through the sampling opening of the ion mobility spectrum analysis device.