The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Jun. 21, 2012
Applicants:

Ryan Val Peacock, Baltimore, MD (US);

Donald Jonathan Largent, Hampstead, MD (US);

Sylvain Dominique Masset, Reisterstown, MD (US);

Inventors:

Ryan Val Peacock, Baltimore, MD (US);

Donald Jonathan Largent, Hampstead, MD (US);

Sylvain Dominique Masset, Reisterstown, MD (US);

Assignee:

HAMILTON ASSOCIATES, INC., Owings Mills, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
G01N 15/06 (2013.01); G01N 2015/0662 (2013.01);
Abstract

A preferred form of the invention is directed to a system and method used to test filters. The system preferably includes a base unit and a probe operably associated with the base unit. The probe is configured to be deployed adjacent the filter being tested while the filter is located in an operating position. The probe is further configured to allow an operator to vary the mode of operation of the base unit from the probe. The system is configured to automatically exhaust any residual test sample from the base unit and the probe when the system changes between testing a sample upstream and downstream of the filter. The system further includes noise suppression on at least one of the upstream test sample and downstream test sample. The system further is configured to detect when the probe is connected to the base unit.


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