The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Sep. 14, 2012
Shinya Kumazaki, Chiryu, JP;
Kazuya Furukawa, Chiryu, JP;
Atsushi Kamiya, Chiryu, JP;
FUJI MACHINE MFG. CO., LTD., Chiryu-shi, JP;
Abstract
A tool abnormality determination system is provided. The tool abnormality determination system includes: a tool that machines a workpiece; a control device that includes a storage portion in which a monitoring range is stored and an arithmetic portion for comparing the monitoring range to a load of the tool during machining; and an interface device that can notify, when the load of the tool exceeds the monitoring range, an operator of a question regarding whether or not the tool is in an abnormal condition other than abrasion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile