The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Oct. 21, 2014
Teknologian Tutkimuskeskus Vtt, Vtt, FI;
Jarkko Antila, Helsinki, FI;
Jussi Tenhunen, Kiiminki, FI;
TEKNOLOGIAN TUTKIMUSKESKUS VTT OY, Espoo, FI;
Abstract
A device and a method for optical measurement of a target, wherein the target is irradiated with radiation beam () and a measurement beam () is received from the target and detected. Commonly used absorbance, reflectance and fluorescence measurements do not provide adequate information in e.g. measuring small contents of sulphur compounds. The present solution provides a new Raman spectrometer which is suitable for mass applications. A target is activated with pulses of a laser diode (). The Raman signatures are measured and integrated successively with a point detector (). A Fabry-Perot interferometer () on the measurement path is successively controlled into corresponding pass bands. While high spectral resolution or range is not required it is possible to use small-sized and low cost components.