The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Feb. 11, 2016
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Hideto Ishiguro, Shiojiri, JP;
Tsukasa Eguchi, Matsumoto, JP;
Hitoshi Tsuchiya, Suwa, JP;
Megumu Ito, Suwa, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); A61B 5/1495 (2006.01); A61B 5/00 (2006.01); A61B 5/1455 (2006.01); A61B 5/024 (2006.01); G01N 21/47 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); A61B 5/02416 (2013.01); A61B 5/1455 (2013.01); A61B 5/1495 (2013.01); A61B 5/14551 (2013.01); A61B 5/681 (2013.01); A61B 5/6824 (2013.01); G01N 21/474 (2013.01); G01N 21/4785 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0233 (2013.01); A61B 2562/0233 (2013.01); G01J 2001/444 (2013.01); G01N 21/31 (2013.01); G01N 21/4795 (2013.01);
Abstract
A component measurement apparatus includes: a sensor module that receives reflected light and outputs a signal corresponding to light intensity of the reflected light; a calibration plate that outputs first reflected light to the sensor module, the first reflected light being used for comparing the light intensity of the reflected light; and a calibration unit that switches the input reflected light to the sensor module between the second reflected light reflected at a measured portion, and the first reflected light.