The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Sep. 17, 2015
Applicant:

Tripath Imaging, Inc., Burlington, NC (US);

Inventors:

William Alan Fox, Burlington, NC (US);

Charles L. Carrico, Burlington, NC (US);

Assignee:

Becton, Dickinson and Company, Franklin Lakes, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B04B 13/00 (2006.01); B01D 21/26 (2006.01); B04B 11/04 (2006.01); B04B 5/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
B01D 21/262 (2013.01); B04B 5/0414 (2013.01); B04B 11/04 (2013.01); B04B 13/00 (2013.01); B04B 2011/046 (2013.01); G01N 2035/00504 (2013.01);
Abstract

The invention provides a sequential centrifuge for centrifuging discrete samples. Methods of more efficiently centrifuging discrete samples sequentially are also provided. The apparatus and methods for sequentially centrifuging discrete samples provide improved operating efficiencies over conventional batch centrifuges. Such advantages include reducing dwell time, increasing system throughput, reducing sample processing system footprint, and improving precision of the analytical process. The sequential centrifuge further provides the capability of handling critical samples without compromising the operating efficiencies achieved in centrifuging discrete samples in a sequential manner.


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