The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Nov. 30, 2016
Bertec Corporation, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Scott Zerkle Barnes, Thornville, OH (US);
Lewis Michael Nashner, Watertown, MA (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A force measurement system is disclosed herein. The force measurement system includes a force measurement assembly configured to receive a subject thereon, at least one visual display device having an output screen, and one or more data processing devices configured to generate a screen image comprising a plurality of substantially concentric bands on the output screen of the at least one visual display device that is configured to create a visual stimuli for the subject disposed on the force measurement assembly. A method for testing a subject is also disclosed herein. The method for testing a subject utilizes reality-altering glasses that are used to perturb a visual input of a subject. Also, in one or more embodiments, the reality-altering glasses are used in conjunction with a force measurement assembly configured to receive the subject thereon.