The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Jun. 19, 2014
Applicant:

Zte Corporation, Shenzhen, Guandong Province, CN;

Inventors:

Linmei Mo, Shenzhen, CN;

Yajun Zhao, Shenzhen, CN;

Hanqing Xu, Shenzhen, CN;

Yonghong Gao, Shenzhen, CN;

Aijun Cao, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/00 (2009.01); H04W 48/16 (2009.01); H04W 24/08 (2009.01); H04W 48/12 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 48/12 (2013.01); H04W 48/16 (2013.01);
Abstract

A discovery signal measurement method, base station and terminal, wherein the method includes: a base station determining measurement patterns used by different terminals for measuring discovery signals according to transmission patterns of discovery signals; the base station configuring measurement patterns corresponding to the terminals for the terminals; the base station transmitting the discovery signals in cells corresponding to the transmission pattern according to the transmission patterns. The method, base station and terminal according to the embodiment of the present invention provide a definite solution for configuring measurement patterns of discovery signals.


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