The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
May. 27, 2015
Applicant:
Faro Technologies, Inc., Lake Mary, FL (US);
Inventors:
Gerrit Hillebrand, Waiblingen, DE;
Rasmus Debitsch, Fellbach, DE;
Rolf Heidemann, Stuttgart, DE;
Martin Ossig, Tamm, DE;
Johannes Buback, Korntal-Munchingen, DE;
Assignee:
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01B 11/25 (2006.01); G06T 7/55 (2017.01); H04N 5/232 (2006.01); H04N 5/77 (2006.01); G09G 5/00 (2006.01); G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0296 (2013.01); G01B 11/2545 (2013.01); G06T 7/55 (2017.01); H04N 5/23293 (2013.01); H04N 5/772 (2013.01); H04N 13/0242 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10028 (2013.01); G09G 5/00 (2013.01); G09G 5/02 (2013.01); G09G 2340/12 (2013.01); G09G 2340/14 (2013.01);
Abstract
A device and method for scanning and measuring an environment is provided. The method includes providing a three-dimensional (3D) measurement device having a controller. Images of the environment are recorded and a 3D scan of the environment is produced with a three-dimensional point cloud. A first movement of the 3D measurement device is determined and then an operating parameter of the 3D measurement device is changed based at least in part on the first movement.