The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Dec. 07, 2015
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventors:

Hiroaki Iwasaki, Niiza, JP;

Ryo Hatakeyama, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/365 (2011.01); H04N 5/361 (2011.01); H04N 5/217 (2011.01);
U.S. Cl.
CPC ...
H04N 5/365 (2013.01); H04N 5/2173 (2013.01); H04N 5/361 (2013.01);
Abstract

An imaging device, comprising a dark image data imaging section for acquiring first dark image data acquired by shooting in a state where a light beam incident on the imaging surface of the image sensor is shielded, before acquiring first image data that has been read out from the image sensor, and second dark image data acquired by shooting in a state where a light beam incident on the imaging surface of the image sensor is shielded after the second image data that was finally acquired, a corrected image data generating section for generating dark corrected image data by carrying out combination processing based on a comparison result of comparing the first and second dark image data, or an averaging computation result, and a correction section for correcting fixed pattern noise within the cumulatively combined image data using the dark corrected image data.


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