The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Mar. 14, 2014
Yale University, New Haven, CT (US);
Joerg Bewersdorf, Branford, CT (US);
Fang Huang, New Haven, CT (US);
Yale University, New Haven, CT (US);
Abstract
Techniques for processing imaging data contaminated by sensor-dependent noise. An imaging method is described. In the imaging method, imaging data corresponding to an imaged region and acquired by at least first and second sensor elements is obtained. A parameterized model is fitted to the imaging data. The parameterized model includes a first sensor-dependent model of noise generated by the first sensor element in a first portion of the imaging data acquired by the first sensor element, and a second sensor-dependent model of noise generated by a second sensor element in a second portion of the imaging data acquired by the second sensor element. The first sensor-dependent noise model differs, at least in part, from the second sensor-dependent noise model.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile