The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Mar. 04, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Akira Eguchi, Tucson, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); H04N 5/232 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G06T 5/50 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/20052 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30024 (2013.01); H04N 2201/0039 (2013.01);
Abstract

The image estimating method is configured to estimate, using image data generated by capturing an object via an image-pickup optical system at a plurality of positions that are spaced at first intervals in an optical-axis direction of the image-pickup optical system, image data at a position different from the plurality of positions. The image estimating method includes an image acquiring step of acquiring image data, a frequency analyzing step of calculating a transverse cutoff frequency in a direction perpendicular to the optical-axis direction based on the image data acquired in the image acquiring step, and an interval calculating step of calculating the first interval based on the transverse cutoff frequency calculated by the frequency analyzing step.


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