The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Jun. 22, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Yumi Yanai, Yokohama, JP;
Shinjiro Hori, Yokohama, JP;
Tetsuya Suwa, Yokohama, JP;
Hidetsugu Kagawa, Kawasaki, JP;
Tomokazu Ishikawa, Yokohama, JP;
Wakako Tanaka, Inagi, JP;
Tohru Ikeda, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An image processing apparatus for performing a process of detecting a unique portion that occurs periodically in an inspection target image, includes: a dividing unit for dividing a part area of the inspection target image into a plurality of division areas; an averaging unit for changing a phase of the plurality of division areas in the part area and averaging pixel values in each of the plurality of division areas in each of changed phases; an addition unit for adding averaged values in each of the plurality of division areas in each of changed phases; and a setting unit for, with respect to a period λ with which the unique portion of a detection target appears, setting a size S of each of the plurality of division areas in a direction in which the unique portion may appear with the period λ, so as to meet S<λ.