The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Jun. 26, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Omer Tripp, Bronx, NY (US);

Emmanuel Wurth, Saubens, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/14 (2006.01); G06F 12/16 (2006.01); G08B 23/00 (2006.01); H04L 29/06 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); H04L 63/1458 (2013.01); H04L 67/02 (2013.01); H04L 67/42 (2013.01);
Abstract

A method for measuring robustness of web services includes selecting a web-service method for testing. The request pattern with the slowest response by the web-service method from a series of request patterns is selected as a request pattern for testing. The series of request patterns includes irregular requests, each having a payload aimed at destabilizing the web service. A test is applied to the web-service method, using the selected request pattern applied at an increasing frequency to the web-service method. The response time of the request pattern is monitored by the web-service method. The frequency of the applied request pattern when a threshold maximum time for response of the web-service method to the request pattern is reached, or when the method fails, is determined by a computer processor. A metric is determined for the web-service method based on the frequency of the applied request pattern required to reach the threshold.


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