The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Dec. 09, 2016
National Instruments Corporation, Austin, TX (US);
Stephen L. Dark, Austin, TX (US);
Daniel J. Baker, Austin, TX (US);
Johnathan R. W. Ammerman, Spokane, WA (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
Various embodiments are described of devices and associated methods for processing a signal using a plurality of vector signal analyzers (VSAs). An input signal may be split and provided to a plurality of VSAs, each of which may process a respective frequency band of the signal, where the respective frequency bands have regions of overlap. Each VSA may adjust the gain and phase of its respective signal such that continuity of phase and magnitude is preserved through the regions of overlap. The correction of gain and phase may be accomplished by a complex multiply with a complex calibration constant. A complex calibration constant may be determined for each VSA by comparing the gain and phase of one or more calibration tones generated with each region of overlap, as measured by each of the VSAs.