The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Nov. 20, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mattias B. Borg, Rueschlikon, CH;

Kirsten E. Moselund, Rueschlikon, CH;

Heike E. Riel, Rueschlikon, CH;

Heinz Schmid, Rueschlikon, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 29/78 (2006.01); H01L 29/16 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0657 (2013.01); H01L 21/02381 (2013.01); H01L 21/02543 (2013.01); H01L 21/02546 (2013.01); H01L 21/02639 (2013.01); H01L 21/02647 (2013.01); H01L 29/16 (2013.01); H01L 29/785 (2013.01); H01L 21/02667 (2013.01);
Abstract

A method for manufacturing a semiconductor structure comprises the steps of: providing a substrate including a first semiconductor material; forming a dielectric layer on a surface of the substrate; forming an opening in the dielectric layer having a bottom reaching the substrate; providing a second semiconductor material in the opening and on the substrate, the second semiconductor material being en-capsulated by a further dielectric material thereby forming a filled cavity; melting the second semiconductor material in the cavity; recrystallizing the second semi-conductor material in the cavity; laterally removing the second semiconductor material at least partially for forming a lateral surface at the second semiconductor material; and forming a third semiconductor material on the lateral surface of the second semiconductor material, wherein the third semiconductor material is different from the second semiconductor material.


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