The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9767578 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 19, 2017

Filed:

Jun. 02, 2015
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Hideto Motomura, Kyoto, JP;

Yoshikuni Sato, Fukui, JP;

Yasuhiko Adachi, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 7/18 (2006.01); G06T 7/40 (2017.01); G06T 7/00 (2017.01); G06K 9/00 (2006.01); G06T 7/90 (2017.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/408 (2013.01); G06K 9/00134 (2013.01); G06T 7/0012 (2013.01); G06T 7/90 (2017.01); G06K 9/2018 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30024 (2013.01);
Abstract

An image measurement device including: light sources that irradiate light beams having different peak wavelengths; a staining method obtaining unit which obtains information indicating a staining method of an inspection specimen; an image obtaining unit which: selects a combination of light sources according to the staining method, based on illumination information; and capture inspection images of the inspection specimen with light beams from the selected light sources, and capture reference images of a reference specimen with light beams from the respective light sources; a calculating unit which calculates a positivity based on the inspection images; and an evaluation unit which associates the staining method of the reference specimen with the combination of light sources to generate the illumination information based on a total value of coefficients in a linear sum of the ortho-normalization base vectors of a spectral distribution of light sources calculated based on the reference images.


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Motomura, Hideto. (2017). Image measurement device and image measurement method (U.S. Patent No. 9767578). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9767578

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