The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Dec. 03, 2015
General Electric Company, Schenectady, NY (US);
Wei Wang, Beijing, CN;
Yang Gao, Beijing, CN;
Wei Wei, Beijing, CN;
Feifei Zhou, Beijing, CN;
Nan Cao, Beijing, CN;
Qingyu Ma, Beijing, CN;
Yong Tao, Beijing, CN;
Xueming Zeng, Beijing, CN;
General Electric Company, Schenectady, NY (US);
Abstract
The present invention relates to a method and apparatus for measuring rotation parameters of a spine on medical images. The method comprises: selecting a reference image and a movement image from the medical images; determining a lower spine image and an upper spine image in the reference image, and determining a lower spine image and an upper spine image in the movement image; registering the lower spine image in the movement image with the lower spine image in the reference image; correcting the upper spine image in the movement image according to output parameters of registration of the lower spine images; superposing the upper spine image in the reference image with the corrected upper spine image in the movement image to obtain a superposed image; and calculating to obtain the rotation parameters according to a position difference between the upper spine image in the reference image and the upper spine image in the movement image on the superposed image.