The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Dec. 05, 2011
Ingwer-curt Carlsen, Hamburg, DE;
Thomas Koehler, Norderstedt, DE;
Gerhard Martens, Henstedt-Ulzburg, DE;
Ewald Rossl, Ellerau, DE;
Rafael Wiemker, Kisdorf, DE;
Ingwer-Curt Carlsen, Hamburg, DE;
Thomas Koehler, Norderstedt, DE;
Gerhard Martens, Henstedt-Ulzburg, DE;
Ewald Rossl, Ellerau, DE;
Rafael Wiemker, Kisdorf, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A method and a device for analyzing a region of interest in an object is proposed. The method comprises: (a) providing measurement data by a differential phase contrast X-ray imaging system, and (b) analyzing characteristics of the object in the region of interest. Therein, the measurement data comprise a 2-dimensional or 3-dimensional set of pixels wherein for each pixel the measurement data comprises three types of image data spatially aligned with each other, including (i) absorption representing image data A, (ii) differential phase contrast representing image data D, and (iii) coherence representing image data C. The analyzing step is based, for each pixel, on a combination of at least two of information comprised in the absorption representing image data A and information comprised in the differential phase contrast representing image data D and information comprised in the coherence representing image data C.