The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Sep. 12, 2013
Keiji Kojima, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Keiji Kojima, Kanagawa, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
RICOH COMPANY, LIMITED, Tokyo, JP;
Abstract
An image inspection apparatus for checking an image printed on a recording medium includes: a reference pixel obtaining unit configured to generate a reference image and obtain a first pixel value from the reference image; a print pixel obtaining unit configured to extract an image printed area and obtain a second pixel value from the image; an offset processing unit configured to add a non-image-printed area; and an image checking unit configured to compute a difference between the first image pixel value and the second image pixel value and detect an error when the difference is higher than a predetermined threshold value, wherein the non-image-printed area contains a third pixel value that is different from the first pixel value or the second pixel value, and the image checking unit suspends a determination whether or not there is an error in the image printed area associated with the non-image-printed area.