The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
May. 31, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Sanjeev Jagannatha Koppal, Gainesville, FL (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/50 (2006.01); G06T 7/30 (2017.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G06T 7/30 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01);
Abstract
A method of improving depth sensor data in real-time based on scene sensor data is provided that includes aligning depth images of depth-scene image pairs generated by a depth-scene image sensor pair with corresponding scene images wherein, for each depth-scene image pair, the depth image is warped such that locations of depths in the depth image are aligned with locations of corresponding pixels in the scene image, and improving at least some of the aligned depth images based on image data from one or more of the scene images.