The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
May. 13, 2013
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Hiroki Nakayama, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 5/02 (2006.01); G06F 17/30 (2006.01); G06Q 30/02 (2012.01); G06N 3/00 (2006.01); G06N 99/00 (2010.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 5/025 (2013.01); G06F 17/30943 (2013.01); G06N 3/004 (2013.01); G06N 3/0436 (2013.01); G06N 3/086 (2013.01); G06N 99/005 (2013.01); G06Q 30/02 (2013.01);
Abstract
A system includes a free itemset generation unit to generate a set of free itemsets, each having a frequency in the database greater than or equal to a predetermined threshold value set in advance, a valid rule candidate generation unit to generate rule candidates and store the generated rule candidates, and a rule minimality decision unit to check minimality of each of the generated rule candidates and output the generated rule candidate to an output apparatus when the generated rule candidate is determined to be minimal.