The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
May. 16, 2013
Yukinaka Uchiyama, Tokyo, JP;
Fumihiro Hasegawa, Tokyo, JP;
Yukinaka Uchiyama, Tokyo, JP;
Fumihiro Hasegawa, Tokyo, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
A pattern extracting device, an image projecting device, a pattern extracting method, and a program capable of extracting all the feature points by interpolating defective feature points even when there are defective feature points of an image pattern. The pattern extracting device extracts feature points to be interpolated based on a captured image of a projected image pattern, and interpolates the feature point to be interpolated by using near-by feature points that are located near the feature point, divides the near-by feature points into groups, calculates extrapolation coordinates of the groups, and calculates coordinates of the feature point to be interpolated in view of significance of the extrapolation.