The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Jun. 15, 2015
Udp Technology Ltd., Seoul, KR;
Vca Technology Ltd, Chessington, Surrey, GB;
Neil Stanley Robinson, Surbiton, GB;
Benjamin Andrew White, Sanderstead, GB;
Geoffrey Lawrence Thiel, East Molesey, GB;
Benjamin Benfold, Farnborough, GB;
Yeon Hag Chou, Seoul, KR;
Seung Chan Lee, Seoul, KR;
Seung Il Chung, Seoul, KR;
UDP Technology Ltd., Seoul, KR;
VCA TECHNOLOGY LTD, Chessington, Surrey, GB;
Abstract
The present invention relates to a system and a method of monitoring a queue that allow for exactly recognizing objects in a queue and exactly monitoring the situation of the queue by tracking the recognized objects, using depth detection device such as a TOF camera. According to the present invention, it is possible to map a space and an image using depth information provided through a depth detection device without mapping a 3D space to an image taken by a camera and exactly measure the actual heights of objects from the ground using depth information of the objects and the background and initial parameters of the depth detection device so that desired objects can be exactly detected and recognized in filtering. Accordingly, the system can be less complicated. Further, waiting time is assigned to recognized objects so that they can be easily tracked.