The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Jan. 15, 2014
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Nobuhisa Shiraishi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00228 (2013.01); G06K 9/00771 (2013.01); G06T 7/246 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/30201 (2013.01);
Abstract

An analysis processing systemincludes: an object detection unitwhich acquires an image taken with a camera, detects an object having a preset feature in the acquired image, and sets a predetermined range with reference to a position where the object is detected in the image, as an object region; and a new object region specification unitwhich, on the basis of information of the object region, specifies the object region including an object newly appearing in a newly acquired image as a new object region, and sets a priority degree representing the degree of priority of execution of predetermined analysis processing on the new object region so as to be higher than the priority degree of the other object region.


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