The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Jul. 09, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Praveen Murthy, Fremont, CA (US);

Bogdan Copos, Davis, CA (US);

Thuan Pham, Sunnyvale, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 9/445 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 8/65 (2013.01); G06F 8/68 (2013.01); G06F 2221/033 (2013.01);
Abstract

A method of vulnerability analysis of a deployed program (program) includes inputting a binary program under analysis (BPUA) derived from the program. The method includes analyzing input/output (I/O) behavior of the program. The method includes discovering inputs to the program based on application of exploration techniques to the BPUA and analysis of the I/O behavior. The method includes determining which of the inputs are negative inputs. The negative inputs are inputs that trigger a response that includes a vulnerability of the program. Based on the negative inputs and triggered responses, the method includes developing a patch for the program that modifies the program to process at least some of the negative inputs without triggering a response that includes the vulnerability. The method includes automatically dispatching the patch.


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