The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Jun. 30, 2014
Emc Ip Holding Company Llc, Hopkinton, MA (US);
John M. Bent, Los Alamos, NM (US);
Sorin Faibish, Newton, MA (US);
Zhenhua Zhang, Beijing, CN;
Xuezhao Liu, Beijing, CN;
Jingwang Zhang, Beijing, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
End-to-end data integrity is provided in parallel computing systems, such as High Performance Computing (HPC) environments. An exemplary method is provided for processing data in a distributed data storage system by obtaining the data and one or more corresponding checksum values from a compute node; and providing the data and the one or more corresponding checksum values to the distributed data storage system for storage. One or more checksum values corresponding to the data can be generated if the one or more checksum values are not received from a compute node. Exemplary processes are provided for copy; slice; merge: and slice and merge functions. The distributed data storage system comprises, for example, one or more Parallel Log-Structured File System (PLFS) storage elements and/or key-value storage elements storing one or more key-value pairs.