The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

May. 11, 2015
Applicant:

Em Microelectronic-marin SA, Marin, CH;

Inventors:

Jean-Michel Daga, Aix-en-Provence, FR;

Alexandre Deschildre, Marin, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/08 (2016.01); G06F 12/0891 (2016.01); G06F 5/06 (2006.01); G06F 5/12 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0891 (2013.01); G06F 5/06 (2013.01); G06F 5/12 (2013.01); G06F 2212/1028 (2013.01); G06F 2212/1044 (2013.01); G06F 2212/45 (2013.01); G06F 2212/69 (2013.01);
Abstract

The present invention concerns a method of operating a first-in first-out memory () arranged to store measurement data samples measured by a plurality of data measurement sensors (), which can operate at various sampling rates. The oldest measurement data sample in the memory () is arranged to be read first before the newer measurement data samples. The method comprises: receiving measurement data samples from at least two data measurement sensors (); and saving the received measurement data samples in the memory (). Each of the measurement data samples saved in the memory is associated with a tag which is also saved in the memory () and which identifies the data measurement sensor () which measured the respective measurement data sample.


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