The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Sep. 20, 2010
Suzuko Chida, Bellevue, WA (US);
Nirav P Desai, Issaquah, WA (US);
Ravikumar Makam, Bellevue, WA (US);
Kyung Deuk Park, Bellevue, WA (US);
Kyle Andrew Farrell, Seattle, WA (US);
Michael C. Moore, Issaquah, WA (US);
Suzuko Chida, Bellevue, WA (US);
Nirav P Desai, Issaquah, WA (US);
Ravikumar Makam, Bellevue, WA (US);
Kyung Deuk Park, Bellevue, WA (US);
Kyle Andrew Farrell, Seattle, WA (US);
Michael C. Moore, Issaquah, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
An environment and techniques for intelligently selecting which tests of multiple different tests to run on a particular section or sections of code, such as one or more lines of code that a developer has altered, are described herein. In this manner, the techniques may allow developers to receive feedback on their software more quickly by running a subset of tests, rather than each test in a predefined set of tests.