The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Jan. 22, 2014
Hitachi Data Systems Corporation, Santa Clara, CA (US);
Ronald Ray Trimble, Acton, MA (US);
Jon Christopher Kennedy, Marlborough, MA (US);
Timmie G. Reiter, Charlotte, NC (US);
David Michael Biernacki, Woonsocket, RI (US);
Carey Jay McMaster, Stow, MA (US);
Stefan Merrill King, Belmont, MA (US);
HITACHI DATA SYSTEMS CORPORATION, Santa Clara, CA (US);
Abstract
A system configured to compute match potential between first data and second data is provided. The system includes data storage storing the first data and the second data, and at least one processor coupled to the data storage. The at least one processor is configured to identify a first sequence of fingerprints characterizing a first plurality of sections of the first data, the first sequence being ordered according to an order of the first plurality of sections within the first data; identify a second sequence of fingerprints comprising fingerprints that match fingerprints within the first sequence, the second sequence of fingerprints characterizing a second plurality of sections of the second data, the second sequence being ordered according to an order of the second plurality of sections within the second data; quantify a similarity between the first sequence and the second sequence; and adjust the match potential based on the similarity.