The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Aug. 17, 2016
Olympus Corporation, Tokyo, JP;
Atsuyoshi Shimamoto, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Provided is a method for calculating a scanning pattern of light and an optical scanning apparatus. The method includes the steps of: detecting a resonance frequency and an attenuation coefficient of an oscillation part of an optical fiber which guides light from a light source and irradiates an object with the light; and calculating a scanning pattern of the light, based on the detected resonance frequency and attenuation coefficient. The apparatus includes: an optical fiber which guides light from a light source and irradiates an object with the light; a scanning part which drives an oscillation part oscillatably supported of the optical fiber; a detector which detects a resonance frequency of the oscillation part; a calculation part which determines an irradiation position of the light using a scanning pattern calculated based on the resonance frequency detected by the detector and the attenuation coefficient obtained in advance.