The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Nov. 10, 2014
Raytheon Company, Waltham, MA (US);
Duane D. Smith, Rancho Palos Verdes, CA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
Method and apparatus for measuring a Doppler effect of a scattered light include: projecting an ultra violet (UV) light towards a target by a light emitter; receiving the UV light scatter from the target from the emitted UV light reflected from the target by a light receiver; measuring the frequency shift of the UV light scatter with respect to the emitted UV light to obtain distribution of line of sight velocity of macroscopic matters of the target corresponds to a Doppler shift; processing the distribution of the line of sight velocity to determine the Doppler effect of the UV light scatter; and separating the wind line of sight velocity as the centroid shift of the microscopic Doppler shift probability distribution.