The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Sep. 25, 2014
Applicants:
Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;
Inter-university Research Institute Corporation High Energy Accelerator Research Organization, Tsukuba-shi, Ibaraki, JP;
Inventors:
Masao Yano, Sunto-gun, JP;
Kanta Ono, Tsukuba, JP;
Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01N 23/06 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/063 (2013.01); G01N 23/04 (2013.01); G01N 27/72 (2013.01); G01N 2223/405 (2013.01);
Abstract
A method, system and apparatus are provided to measure magnetic characteristics of a comparatively thick magnetic sample in a magnetic field or nonmagnetic field by X-ray magnetic circular dichroism (XMCD). In particular, the method, system and apparatus measure the magnetic characteristics of the thick magnetic sample by irradiating the sample with X-ray, and detecting transmissive X-ray passing through the sample.