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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9766184 B1

PDFFull Text
Date of Patent:
Sep. 19, 2017

Filed:

Oct. 29, 2015

Surface features characterization

Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Joachim Walter Ahner, Livermoore, CA (US);

Stephen Keith McLaurin, Sunnyvale, CA (US);

Samuel Kah Hean Wong, Johor Bahru, MY;

Henry Luis Lott, Fremont, CA (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:

Tri Ton

Assistant Examiner:

Jarreas C Underwood

Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/88 (2006.01); G01N 21/17 (2006.01); G01N 21/47 (2006.01); G01N 21/94 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01B 11/24 (2013.01); G01N 21/88 (2013.01); G01N 21/00 (2013.01); G01N 21/17 (2013.01); G01N 2201/061 (2013.01);
Abstract

Provided herein is an apparatus, including two photon emitters and a photon detector array. The two photon emitters are configured to emit photons onto an entire surface of an article. The photon detector array includes a number of photon detectors configured to detect photons scattered from features in the entire surface of the article, wherein the features are less than 500 nm in their largest dimension.

Find Patent Forward Citations

Ahner, Joachim. (2017). Surface features characterization (U.S. Patent No. 9766184). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9766184

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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