The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Dec. 22, 2015
Trioptics Gmbh, Wedel, DE;
TRIOPTICS GMBH, Wedel, DE;
Abstract
A method for measuring the positions of centers of curvature of optical surfaces of a single- or multi-lens optical system, an imaging lens system simultaneously images an object plane into a first and a second image plane. The optical system is arranged so that a supposed position of a first center of curvature is situated in the first image plane of the imaging lens system and a supposed position of a second center of curvature is situated in the second image plane of the imaging lens system. An object arranged in the object plane is then imaged simultaneously or sequentially at the first and the second image plane by means of measuring light. Reflections of the measuring light at optical surfaces of the optical system are detected by means of a spatially resolving light sensor. The actual positions of the first and the second center of curvature are calculated from the detected reflexes.