The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
Dec. 12, 2013
Ixblue, Marly le Roi, FR;
Joachin Honthaas, Paris, FR;
Herve Lefevre, Paris, FR;
Eric Ducloux, Rueil Malmaison, FR;
Jean-Jacques Bonnefois, Saint-Cloud, FR;
IXBLUE, Saint-Germain, FR;
Abstract
An interferometric measurement device includes a broad-spectrum spontaneous emission light source; a measurement interferometer, receiving a light signal with input light power and delivering a modulated light signal with output light power, the modulated light signal being modulated at a modulation frequency, depending on a physical parameter to be measured and being proportional to the input light power; an optical radiation detector, receiving the modulated light signal exiting from the measurement interferometer and delivering a modulated electrical signal representative of the output light power; a filtering interferometer, insensitive to the physical parameter to be measured, having a free spectral range ISL and a finesse F selected such that an interval of frequencies, centerd around an optimal frequency fequal to (2k+1)ISL/2, k being a natural number, and of width Δf equal to [0.9−(3/2F)]ISL, includes the modulation frequency of the modulated light.