The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2017
Filed:
May. 08, 2015
Applicant:
Renishaw Plc, Wotton-under-Edge, Gloucestershire, GB;
Inventors:
Assignee:
RENISHAW PLC, Wotton-under-Edge, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05C 11/10 (2006.01); B32B 41/00 (2006.01); B41J 3/407 (2006.01); B41J 11/00 (2006.01); B41J 11/46 (2006.01); B05C 9/12 (2006.01); B05C 9/14 (2006.01); B32B 37/12 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
B05C 11/1005 (2013.01); B05C 9/12 (2013.01); B05C 9/14 (2013.01); B32B 41/00 (2013.01); B41J 3/407 (2013.01); B41J 11/002 (2013.01); B41J 11/46 (2013.01); G01D 5/34707 (2013.01); B32B 37/12 (2013.01); B32B 2041/04 (2013.01); B41P 2200/31 (2013.01); B41P 2233/50 (2013.01); G01D 5/347 (2013.01); G01D 5/34746 (2013.01); G01D 5/34776 (2013.01); G01D 5/34784 (2013.01);
Abstract
A method of applying a marking onto a metrological scale. The method includes locating one or more markings on the scale substrate in a provisional state; checking whether the one or more markings located on the scale substrate are acceptable; and finalizing the one or markings which are acceptable so as to transform the one or more markings into a finalized state.