The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2017

Filed:

Feb. 04, 2015
Applicants:

University of Southern California, Los Angeles, CA (US);

California Institute of Technology, Pasadena, CA (US);

Inventors:

Jeffrey P. Fingler, Orange, CA (US);

Scott E. Fraser, Glendale, CA (US);

Assignees:

UNIVERSITY OF SOUTHERN CALIFORNIA, Los Angeles, CA (US);

CALIFRONIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01); G01B 9/02 (2006.01); F21V 8/00 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/10 (2013.01); A61B 3/1233 (2013.01); G01B 9/02091 (2013.01); G02B 6/0005 (2013.01); G01N 21/4795 (2013.01);
Abstract

This disclosure relates to the field of Optical Coherence Tomography (OCT). This disclosure particularly relates to an OCT system having a configuration that uses a phase sensitive B-scan registration method. In this disclosure, an OCT system may have a configuration that scans a physical object, acquires OCT signals to form B-scans, uses these B-scans to determine an optimal shift in an axial direction by using total phase error between B-scans, and align B-scans, thereby minimizing effects of motion that may occur during scanning of the physical object.


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