The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Oct. 30, 2012
Texas Instruments Incorporated, Dallas, TX (US);
Peter Charles Barnum, Dallas, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method for three dimensional (3D) image processing is provided that includes receiving an image, wherein each location in the image includes a value indicative of a depth of a pixel in a scene and wherein each value has an associated confidence measure, determining whether each similarity region of a plurality of non-overlapping similarity regions in the image is valid or invalid based on a number of values in the similarity region having sufficiently high confidence measures, wherein a similarity region includes contiguous locations in the image having similar values, and indicating that the values in a similarity region are invalid when the similarity region is determined to be invalid.