The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Mar. 31, 2015
Heidelberger Druckmaschinen Ag, Heidelberg, DE;
Werner Huber, Wiesloch, DE;
Thomas Roos, Neulussheim, DE;
Heidelberger Druckmaschinen AG, Heidelberg, DE;
Abstract
A method automatically parameterizes error detection of an image inspection system by a computer. The method includes digitizing a reference image in order to determine desired values and subdividing the reference image into homogeneous image regions with few edges, and inhomogeneous image regions with strongly structured image areas and many edges. Lower tolerance values for the homogeneous image regions, and higher tolerance values for the inhomogeneous image regions of the digitized reference image are determined by statistical image analyses. The determined tolerances are assigned to their respective desired values in dependence on a position of the desired values in homogeneous or inhomogeneous image regions. An inspection sensitivity is calculated from desired values and their respective tolerances. The parameters of the image inspection system are set with the aid of the inspection sensitivity configuration of the image inspection system using the parameters.