The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Jan. 20, 2016
Mediatek Inc., Hsinchu, TW;
Ming-Chou Wu, Miaoli County, TW;
Dimitris Nalbantis, Kent, GB;
Qiang Zhou, San Jose, CA (US);
Bernard Mark Tenbroek, Kent, GB;
Ting-Hsuan Kuo, Changhua County, TW;
MEDIATEK INC., Hsinchu, TW;
Abstract
Methods and apparatus are provided for detection path design for reflection coefficient estimation. In one novel aspect, a hardware-based phase estimator estimates a phase shift between the forward path signal and the reverse path signal. In one embodiment, a data selector is used to pass only signals above a magnitude threshold. In another embodiment, a modified phase unwrap algorithm stores an unwrapping correction for subsequent samples and updates the stored unwrapping correction upon processing of each sample processed. In another novel aspect, mixed hardware and software solutions are used. In one embodiment, the reference signal and the detection signals are matched such that the modulation signal interference is removed. In some embodiments, one or two power detectors and a cross-correlator are used. In yet another embodiment, two detection measurement paths are used to obtain the reflection coefficient. In one embodiment, fractional timing offset is estimated to obtain the reflection coefficient.