The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Aug. 08, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Sashidharan Venkatraman, Hyderabad, IN;

Sthanunathan Ramakrishnan, Bangalore, IN;

Jaiganesh Balakrishnan, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/10 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0624 (2013.01); H03M 1/0626 (2013.01); H03M 1/1009 (2013.01); H03M 1/1215 (2013.01);
Abstract

A system includes a first tracking filter configured to track a frequency domain mismatch profile between component analog-to-digital convertors (ADCs) of an interleaved ADC (IADC), and a second tracking filter configured to a track a frequency independent timing delay mismatch and a timing delay mismatch correction error based on frequency domain mismatch profile estimates. An output of the first tracking filter determines a correction of a frequency dependent mismatch profile in an output of the interleaved ADC and an output of the second tracking filter determines a correction of the timing delay mismatch correction error in the output of the interleaved ADC.


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